- All sections
- G - Physics
- G01T - Measurement of nuclear or x-radiation
- G01T 1/28 - Measuring radiation intensity with secondary-emission detectors
Patent holdings for IPC class G01T 1/28
Total number of patents in this class: 103
10-year publication summary
|
5
|
6
|
8
|
7
|
7
|
9
|
5
|
11
|
2
|
1
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hamamatsu Photonics K.K. | 4161 |
5 |
| Photonis Scientific, Inc. | 22 |
4 |
| Siemens AG | 24990 |
3 |
| Centre National de La Recherche Scientifique | 9632 |
3 |
| ASML Netherlands B.V. | 6816 |
3 |
| C-rad Imaging AB | 5 |
3 |
| Tae Technologies, Inc. | 220 |
3 |
| Adaptas Solutions Pty Ltd | 34 |
3 |
| Board of Regents, The University of Texas System | 5370 |
2 |
| Thermo Finnigan LLC | 625 |
2 |
| Ecole Polytechnique | 308 |
2 |
| FEI Company | 851 |
2 |
| Southern Innovation International Pty Ltd. | 36 |
2 |
| University of Maryland, Baltimore | 999 |
2 |
| Nova Measuring Instruments Inc. | 59 |
2 |
| Shenzhen Genorivision Technology Co., Ltd. | 61 |
2 |
| Hitachi High-Tech Corporation | 4424 |
2 |
| Serac Imaging Systems Ltd | 5 |
2 |
| Koninklijke Philips N.V. | 22975 |
1 |
| Infineon Technologies AG | 8189 |
1 |
| Other owners | 54 |